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Boyue Instrument (Shanghai) Co., Ltd
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Large scale coating thickness gauge
Product Description: M2 BLIZZARD adopts a slotted design, suitable for flat shapes and oversized samples
Product details

The ideal solution for PCB analysis

Slotted desktop micro area XRF spectrometer M2 BLIZZARD

M2 BLIZZARD is a micro area X-ray fluorescence spectrometer launched by Bruker Corporation, which performs non-destructive analysis of material composition and multi-layer coating thickness according to ASTMB568 and DIN/ISO 3497. Adopting slotted design, suitable for flat shaped and oversized samples, such as large printed circuit boards. The instrument is controlled using XSect Pro software from Vision.

Main features:
·Slotted configuration with extendable "large size" sample stage
·Adjustable slot gap (10 or 20 millimeters)
·Equipped with large and durable sample trays for sample positioning
·Optimize XSect Pro operating software
·Advanced XData software for application, standard sample, and database management
·Customizable user interface and test result interface
·Equipped with automatic spectral saving function for post-processing and archiving of measurement results
·User set tolerance allows for easy determination of 'qualified/unqualified'
·Peak Finder "used for qualitative analysis of unknown samples
·The software contains test report templates for customers to edit and use
·Configure an industrial strength foot switch for "start/stop" measurement (optional)
·SPC software can be fully configured to meet customer process requirements (optional)
·The instrument design is simple and sturdy, only requiring one USB cable to connect to a PC

M2 BLIZZARD Industry Applications:

·Large Printed Circuit Board PCB

·semiconductor

·Materials Science

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