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Boyue Instrument (Shanghai) Co., Ltd
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X-ray diffractometer XRD
Thin film stress measuring instrument
Electrical characteristics
Film Adhesion
Surface morphology of silicon wafer/wafer measurement
Charge sensitive preamplifier CUBE
PV/I-V testing
AFM Probes
Ha's consumables
Testing services
DANTE Digital Pulse Processor
Filter cartridge/filter bag
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159218860971592188977117780587719
Address
Room 301, Building 28, Songjiang High tech Park, No. 518 Xinzhuan Road, Songjiang District, Shanghai
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Instrument and meter
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1
products
electrical characteristic
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1
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