Scanning Electrochemical Microscopy System (SECM)

AC Scanning Electrochemical Microscopy System (ac SECM)

Intermittent Contact Scanning Electrochemical Microscopy System (ic SECM)

Micro area electrochemical impedance testing system (LEIS)

Scanning Vibration Click Test System (SVET)

Electrolyte Droplet Scanning System (SDS)

Exchange electrolyte droplet scanning system (ac SDS)

Scanning Kelvin Probe Testing System (SKP)

Non touch micro area morphology testing system (OSP)

Excellent performance

The fast and accurate closed-loop positioning system is specially designed for the nanoscale research needs of electrochemical scanning probes. Combining Uniscan's unique hybrid 32-bit DAC technology, users can choose the optimal configuration for experimental research

Advanced and flexible work platform

The system can provide 9 probe technologies, making M470 the most flexible electrochemical scanning platform in the world.

Comprehensive attachments

7 modules to choose from, 3 different electrolytic cells, various probes, long-distance microscope, and post-processing data analysis software.

M470 New Product Features

SECM automatically processes curves

SECM user-defined processing of curve step size changes

High resolution reading

Manually or automatically adjust the phase

M470 also has the following characteristics:

Tilt correction

Subtraction of X or Y curves (5th order polynomial)

2D or 3D Fast Fourier Transform

Automatic sorting of experiments, probe movement, and area mapping

Graph Experiment Sequencing Engine (GESE)

Support multi area scanning

Multiple data views for all experiments

Peak analysis

M470 is the fourth generation scanning probe system developed by Uniscan Instruments, featuring higher specifications and more probe technologies.

M470 Technical Parameters

Workstation (all technologies)

Scanning range (x, y, z) greater than 100mm

Scan driver resolution up to 0.1nm

Closed loop positioning linear zero lag encoder, directly reads x, z, and y displacements in real time

Axis resolution (x, y, z) 20nm

Maximum scanning speed 12.5mm/s

Measurement resolution 32-bit decoder @ up to 40MHz

Piezoelectric (IC - and AC scanning probe technology)

Vibration range 20nm~2 μ m, peak to peak increments of 1nm

Minimum vibration resolution 0.12nm (16 bit DAC, 4 μ m)

Piezoelectric crystal stretching 100 μ m

Positioning resolution 0.09nm (20 bit DAC, 100 μ m)

Electromechanical

Scanning front-end 500 × 420 × 675mm (H × W × D)

Scan control unit275×450×400mm(H×W×D)

power250W