​ST-X4Probe testing platform

Product features:

1. The overall structure occupies a small space

2. The body is lightweight and affordable in price

3，LED/LD/PDThe intensity of light/wavelength/Optoelectronic testing

4At most, it can be placed6A probe holder that can perform RF testing,

5，optional4cun/8Inch vacuum adsorption chuck, suitable for wafer testing,

6The probe station is applied to various universities/institute/Semiconductor electronic testing and other fields

Product configuration and specifications：

1，by suctionChuck 4Inch stainless steelChuckTravel rangeXdirection25mm/Ydirection25mm

2，ChuckMobile accuracy10MicronsChuckRotation angle0-360°

3，power220VAC ,60HzVacuum-250mmHg,7liter/min

4，Size range approximately longxwidexHeight of about400mmx300mmx500mmWeight approximately25kg(Including)CCDCamera), five，Optional Accessories:Probe holder, microscope system, packaging fixture, shock absorber, darkroom, gold platingChuckProbe arms, probes, test shielded cables, and connector components, etc

Probe holder description:

1，External dimensions80x90x110mm,

2，The weight of the body is approximately2.2kg

3， X-Y-ZMobile range13x13x13mm,

4，Mobile accuracy3μm

5，Base fixing method Adjustable magnetic base

6，Upgrade: Universal adjustment fixture (to be purchased separately)

Probe Description: