Park Systems Atomic Force Microscope XE-7

Instrument Introduction:

A highly cost-effective research tool in the field of nanotechnology. The unique three-axis separation design ensures no coupling effects in the XYZ directions and theoretically eliminates plane distortion errors; At the same time, the independent Z-axis scanner achieves true non-contact scanning, greatly expanding the scope of sample application. The top-down direct view of the optical path facilitates users' observation of the probe and sample. The specially designed probe installation method simplifies the optical path adjustment process and reduces operational difficulty.

Park Systems Atomic Force Microscope XE-7 Technical Parameters:

scanner

XY scanner

Flexible guidance closed-loop control single module scanner

Scanning range 10 μ m * 10 μ m (optional 50 μ m * 50 μ m, 100 μ m * 100 μ m)

Plane offset:<2nm (40 μ m * 40 μ m scan)

Z scanner

Flexible guidance powerful scanner

Scanning range 12 μ m (optional 25 μ m)

Resonance frequency:>5kHz

Surface imaging noise: 0.03nm

Sample stand

Sample size: 100mm * 100mm * 20mm

Sample weight: 500g maximum

Sample stage movement range: 13mm * 13mm

Key Features:

1、 Accurate XY direction scanning completely eliminates cross coupling errors

● Use independent closed-loop XY flatbed scanners and Z-axis scanners

Flat panel scanning scanner with minimal residual bending error

The horizontal linear error within the entire scanning range is less than 2nm

Accurate height measurement

II Non-Contact ™ The (truly non-contact) mode can extend the lifespan of the needle tip, provide high resolution, and protect the sample

The Z servo speed is 10 times that of piezoelectric ceramic tubes

Non contact mode can reduce needle tip wear and extend service life

● Imaging resolution superior to similar atomic microscopes

Enhance sample compatibility and improve scanning accuracy

3、 Zui Rich Function Expansion

● Supports multiple SPM modes

● Supports multiple optional measurement modes

● Supports various optional accessories, with superior expansion performance

4、 Zui is designed for convenient use

Open sample space to improve the efficiency of sample and needle tip replacement

Pre aligned needle tip installation and coaxial direct view optical path intuitively achieve laser alignment

The tailcoat lock facilitates the disassembly of the scanning head