Olympus metallographic microscopeBX51 is a research grade upright metallographic microscope that covers all observation methods. Equipped with advanced UIS 2 optical system, providing superior optical image quality, the wide field of view PLAPON objective combined with neodymium absorber AAC provides excellent resolution and flatness at all magnifications. The combination of a wide field of view PLAPON objective lens and an achromatic and spherical aberration reducing condenser U-AAC is an ideal choice for DIC and fluorescence observation. The BX51 mirror arm body adopts a split design, which can observe samples with a maximum height of 65mm (reflective dedicated mirror body). It has strong expandability and operability, and a series of accessories are available for selection.
UIS 2The vivid image observed by the objective lens
The UIS 2 objective lens has a rich product lineup of various magnifications, special purpose objectives, etc., which can be selected according to the purpose. In addition, the high quality brought by wavefront aberration control, faithful neutral color display of the sample, etc., the UIS2 objective lens can demonstrate its outstanding performance in both visual observation and digital image observation.
A fine adjustment knob that is easy to focus on and can be freely installed left or right
You can remove the focusing micro adjustment knob according to your own operating habits and install it on the left or right side of the device. The surface coating of the fine-tuning knob is made of rubber, which can be operated by gently touching the fingertip. High micro sensitivity can smoothly achieve high magnification focusing.
The tilted lens barrel that maintains a comfortable observation posture has been added to the product lineup
Equipped with various tilted lens barrels for both eyes and three purposes. During operation, especially the neck can maintain a natural posture, greatly reducing the fatigue of long-term observation.
NDLinkage between Filter and Light and Shadow Field of View Switching
The linkage between ND filter and light dark field of view reflective lighting tube can protect the operator's eyes during sharp changes in brightness.
Differential interferometry system providing optimal observation for different samples
Olympus' differential interference observation adopts a sliding single prism method that is easy to switch between observations. In order to obtain the optimal resolution and contrast suitable for the sample state, three types of DIC prisms were prepared: universal U-BICR, high-resolution U-BICH, and high contrast U-BICHC. In addition, each series of the UIS2 objective lens has a unified pupil position, so there is no need to switch the position of the DIC prism in low magnification to high magnification observations.
Analyzer/polarizer linkage, easy loading and unloading of detection skateboard
When switching from bright field observation to differential interference observation methods, the detection slide of the analyzer/polarizer can be loaded and unloaded at once to quickly complete the switching of observation methods. In addition, the detection slide of the analyzer/polarizer can be installed and removed on either side of the reflective lighting tube.
Different models of stages correspond to multiple samples
In addition to the U-MSSP4 stage with a size of 100 × 100 mm and the U-WHP2 stage capable of carrying 4-inch wafer loaders BH2-WHR43, there are also models such as the transmission observation glass flat U-MSSPG stage that can be used as a shielding loader.
Electric objective lens converter with manual switch to directly switch magnification
In addition to various manual switches that directly switch the magnification of the electric objective lens converter, there is also a center output objective lens converter that is easy to adjust to the correct position during high magnification observation. Can improve observation efficiency and suppress dust adhesion on the sample.
Specification of Olympus metallographic microscope BX51 |
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optical system |
UIS2 optical system (infinite correction) |
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fuselage |
Observation method |
Bright field/dark field/differential interference/simple polarized light/fluorescence |
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Reflection/Transmission |
Reflection/Transmission |
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Lighting device |
Light dark field reflection lighting device (bright field/dark field/differential interference/simple polarized light) |
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lighting |
Reflective lighting |
100 W halogen/100 W mercury/75 W xenon/fiber optic |
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Transmissive illumination |
100 W halogen |
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Focusing unit |
Electric/manual |
Manual |
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trip |
35 mm |
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Resolution/Fine tuning sensitivity |
Rotate the fine-tuning knob once to move 0.1 mm |
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Maximum sample height |
25 mm |
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Objective lens converter |
Electric type |
Clear field differential interference with 6 holes |
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Manual type |
Mingshi Field 5 Holes |
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Carrier platform |
trip |
Lower right (lower left) handle: 76 (X) × 52 (Y) mm |
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Observation tube |
Wide angle field of view (22 fields of view) |
inversion |
Binocular/trinocular/tilted binocular observation tube |
Just like |
Three eye/tilted binocular observation tube |
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Ultra wide field of view (26.5 fields of view) |
inversion |
Three eyed observation tube |
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Just like |
Three eye/tilted three eye observation tube |
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Attachment Unit |
IR unit |
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External dimensions |
317.5 (W) × 602 (D) × 480 (H) mm (standard combination) |
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weight |
20.8 kg (standard combination) |