detailed description:

Our company has launched OLED devices, organic solar cells (OPVs), perovskite solar cells, perovskite LEDs, and other organic and inorganic semiconductor optoelectronic performance measurement systems (carrier mobility measurement systems), electrical performance evaluation systems, emission angle spectroscopy analysis systems, and software simulation and development systems for related devices, providing effective testing tools for researchers and research institutions.

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➢ Main applications:
*Inorganic semiconductor optoelectronic devices, organic semiconductor optoelectronic devices;
*Organic solar cell OPV;
*Perovskite Solar Cell, Perovskite LED;
*Inorganic solar cells (such as silicon-based solar cells such as monocrystalline silicon, polycrystalline silicon, amorphous silicon, etc.);
*Dye sensitized solar cell DSSC;

Main measurement functions:

*Lighting voltage (current voltage illumination characteristics I-V-L)
*Luminescence lifetime, carrier mobility (transient electroluminescence method TEL)

*Measurement of OLED/perovskite LED luminescence characteristics;
*Carrier density, carrier dynamics process (transient photocurrent method TPC)
*Carrier lifetime, carrier conforms to dynamic processes (transient photovoltage/transient open circuit voltage method TPV)
*Carrier mobility (dark injection transient method DIT, single carrier devices&OLEDs)
*Series resistance, geometric capacitance, RC time (Pulse Voltage method)
*Doping density, capacitance, series resistance, carrier mobility (Dark CELIV)
*Carrier mobility, carrier density (linearly increasing carrier transient method photo CELIV under illumination)
*Carrier recombination process, Langmuir function pre recombination factor (time delay linearly increases carrier transient method Delaytime)-CELIV）
*Carrier intensity and carrier mobility at different operating points (injection CELIV transient method with linearly increasing carrier injection)
*Geometric capacitance, capacitance rate (MIS linear increase carrier transient method MIS-CELIV)
*Trap strength, equivalent circuit (impedance spectrum test IS)
*Mobility, trap strength, capacitance, series resistance (capacitance vs frequency C-f)
*Built in voltage, doping concentration, injection barrier, geometric capacitance (capacitance vs voltage C-V)

Measurement technology:

1）IV/IVLcharacteristic:IVandIVLThe curve is designed forOLEDandOPVThe standard measurement method can obtain the current voltage characteristic relationship and the characteristic relationship between current voltage and light intensity of the sample through the curve;
*For organic semiconductor materials, Pmax, FF, Voc, Isc, and mobility can be analyzed by space charge limited current SCLC;|
2) Transient photocurrent response method（Transient Photocurrent）：Research on carrier dynamics and carrier density, etc；
3) Transient photovoltaic voltage（Transient Photovoltage）：Study the carrier lifetime and recombination process;
4) Dual pulse transient photocurrent（Double Transient Photocurrent）：Analyze the dynamic process of charge carrier capture;
5) Dark injection transient method（Dark Injection）：Study the carrier mobility of single carrier devices and OLEDs;
6) Voltage pulse method（Voltage Pulse）Analysis of series resistance, geometric capacitance, and RC effect;
7) Dark state linear boost carrier transient method（Dark-CELIV）：Measurement of impurity concentration, relative dielectric constant, series resistance, and charge carrier mobility；
8) Transient method of linearly boosted charge carriers under illumination（Photo-CELIV）Extracting carrier mobility within organic solar cellsmobility, as well as carrier concentration analysis, etc;
9) Time delayed linear boost carrier transient method（Delaytime-CELIV）Composite dynamic process analysis and Langzhiwan composite factor analysis, etc;
10) Injecting Linear Boosting Carrier Transient Method（Injection-CELIV）Measurement and analysis of charge carrier concentration and charge carrier mobility;
11）MIS-CELIVGeometric capacitance and relative dielectric constant analysis;
12) Impedance spectrum measurement（Impedance Spectroscopy）：Equivalent circuit analysis of components, etc；
13) Capacitance frequency measurement method（C-f）Measurement of mobility, traps, geometric capacitance, and series resistance;
14) Capacitance voltage measurement method（C-V）Built in voltage, impurity concentration, and geometric capacitance measurements;
15) Transient electroluminescence test（Transient Electroluminescence）Extracting charge carriers from OLED devices and measuring phosphorescence lifetime;

In addition, our company provides professional solar testing equipment manufacturers to offer customers a complete set of professional equipment:

1. Solar cell spectral response testing system, IPCE testing system, quantum efficiency testing system;
2. Solar cell measurement system (spectral response testing system, IPCE testing system, quantum efficiency testing system, I-V curve measurement system), solar cell tester;
3. Solar cell I-V curve measurement system;
4. I-V data acquisition system;
5. Large area solar simulator/solar simulator/full spectrum solar simulator;
6. Solar cell sorting machine;
7. Solar cell I-V tester;
8. Spectroradiometer,
9. Reference battery/standard battery,
10. Uniformity image analysis system for solar simulator;
11. Organic solar cell carrier mobility measurement system;
12. Carrier mobility measurement system for perovskite solar cells;
13. Solar cell minority carrier measurement system;