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★ Ion migration test

Ion migration (CAF) testing is a testing method for evaluating the insulation reliability of electronic products or components. The sample is placed in a high-temperature and high humidity environment, and a certain DC voltage (bias voltage) is applied between adjacent insulation networks to detect insulation failure between the two networks under long-term testing conditions.

‍‍Practice has proven that placing test samples in a high-temperature and high humidity environmental test chamber, soldering cables on the circuit board, applying bias voltage, and then periodically removing the PCB from the environmental test chamber for insulation resistance testing, this intermittent testing method will miss out on many actual ion migrations.‍‍

‍‍Effective ion migration testing requires placing the test sample in a high-temperature and high humidity environmental testing chamber, welding cables on the circuit board, and leading them out to relevant testing equipment outside the environmental testing chamber. A bias voltage that promotes ion migration is applied to the circuit board, and insulation resistance testing is performed. At the same time, the leakage current on the test sample can be detected in real time.‍‍

‍‍The main purpose of MIR insulation resistance testing system is:

PCBSubstrate,PCBInsulation reliability testing of components such as capacitors and connectorsSMTFluxEvaluation of Cleaning Processes: Evaluation of Insulation Aging Performance of Electronic Insulation Materials, Cables, and Wires

★ Main features of MIR insulation resistance testing system:

●MIRAdaptation of insulation resistance testing systemIPC, IEC,JPCA,ISO ,BellcoreWaiting for standards.

●eachSlotProvide up to32A testing channel，The system can provide32*n（n=1，2...）Different numbers of channels.

●Modular structure，Not only is it easy to expand，Easy to locate and repair faults.

●Using high-precision insulation resistance meter as the core instrument.

●Temperature and humidity testing of system integration test box.

●eachSlotThe testing parameters can be independently set.

●Can detect open or short circuits in test cables.

●Can calibrate the measurement results of insulation resistance and leakage current.

●Polarity of bias voltage can be changed.

●The insulation resistance can be set to decrease to a certain extent or below a certain value as a criterion for determining the occurrence of ion migration.

●Pioneering the setting of migration and leakage times.

●The system can jump to the insulation resistance verification test.

●Test status and data are presented in tables，curve，Presenting various interfaces such as statistics.

●Real time high-speed detection of leakage current for each channel，Prevent missing out on short and small migrations.

●Each channel of the system is independently equipped with protective circuit resistors and conversion switches.

●for a special purposePCBIon migration testing fixture.

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