summary：

The eighth generation product FT110A of the X-ray fluorescence coating thickness measuring instrument, which has achieved impressive sales since 1978, has new optimizations in measurement accuracy, operational performance, and software.

Through the automatic positioning function, simply place the sample on the sample stage and it can automatically align and observe the focus of the sample within seconds, eliminating the previous manual focusing operation and greatly improving the measurement effect.

Specialty:

1.Auto focus function and automatic approach function
When placing samples of various heights on the sample stage, as long as the height difference is within 80mm, the tested sample can be automatically focused within 3 seconds. This further improves the convenience of positioning operations.

●autofocusConvenient camera focusing

●Automatic approach functionThe most suitable focusing position

2.Improving measurement accuracy through the new thin film FP method

The high sensitivity of small light beams has been achieved, and the accuracy of film thickness measurement has been improved through the use of small collimators. The coating measurement time has been reduced by half compared to our original model. In addition, a new EP method has been developed based on the characteristics of the detector, which can perform standard free measurements. The measurement results can generate a report with just one click, which is simple and convenient.

●New film EP method

Reduced the complexity of producing inspection lines and simplified the setting of measurement conditions

The non-standard measurement method can measure up to 5 layers of film thickness

●Auto focus function and distance correction function

Samples with concave convex differences can be measured using the same measurement conditions as those made by thin film EP method

●Sensitivity improvement

The coating measurement time has been reduced by half compared to our original model

●Generate report function

One click generation of measurement report

3. Wide area sample observation

After taking a static image of the sample placed on the measurement platform (250mm * 200mm), a narrow observation position can be specified on the obtained wide observation image. As a result, the selection time for most measurement point positions can be significantly reduced, as well as the selection time for specific point positions that are difficult to find on the image.

●Wide area image observation

Easy positioning

Model name: FT-110A

Measurement elements: Atomic numbers 22 (Ti)~83 (Bi)

Detector: Proportional counter tube

X-ray tube: Tube voltage: 50kV Tube current: 1mA

Collimators: 4 types (Φ 0.05mm, Φ 0.1mm, Φ 0.2mm, Φ 0.025 × 0.4mm)

Sample observation: CCD camera (capable of wide area observation)

X-Ray Station： Computer, 19 inch LCD monitor

Film thickness measurement software: thin film EP method, standard curve method

Measurement function: automatic measurement, center search

Qualitative functions: KL tagging, comparative representation

Power supply: 220V/7.5A