EM-AFM can be used inSEMSimultaneously providing atomic force microscopy imaging and nanomechanical measurement. It combines the advantages of these two technologies, can obtain high-resolution 3D images at high speed, and observe the interaction of nanoscale forces in real-time at the micro nano and sub nano scales, which is different from conventional methodsSEM/FIBCompatible and compatible withEDS, EBSD, WSDCompatible.

major function

EM-AFM can be used inSEMSimultaneously providing atomic force microscopy imaging and nanomechanical measurement. It combines the advantages of these two technologies and can perform morphology scanning3DImaging, nanoindentation/Nano tensile testing, etc.

lFEATURES

Simultaneously obtainingAFMandSEMimaging

Fully compatible with mainstream scanning electron microscopes

Simple sample replacement

Ultra high resolution morphology scanning

Measurement of Nanoforce by Nanoindentation Method

High operational stability, not affected bySEMElectron beam interference

Vacuum lock compatible

Technical capabilities

3、 Application

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