1. Instrument features
1.1 Radiation Protection
1.2 Multi specification sample warehouse
1.3 X-Y movable sample platform
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1.4 X-Ray detector
1.5 Multiple specifications of test light spots
1.6 Small details, great wisdom
X-ray detector
●Amptek X-123 Si PIN from the United States:
●Be window thickness: 1mil
●Crystal area: 25mm2
●Signal processing system: DP5
●Best resolution: 145eV
●Whole original imported
X-ray tube
●Output voltage: 0~50kV
●Filament current: 0~2mA
●Maximum power: 50W
●Target material: Mo
●Be window thickness: 0.2mm
●service life:2ten thousand hours
high voltage power supply
●Output voltage: 0~50kV
●Filament current: 0~2mA
●Maximum power: 50W
●8-hour stability: 0.05%
camera
●microfocus
●Driver-free
●5-megapixel high-definition camera
High definition camera with zoom function, which can accurately locate the measurement position through CCD manager when the sample contains impurities or is composed of several parts. Through the transparent glass door on the sample compartment, the samples being tested can be observed at any time.
Optical path system
●Automatic switching of multiple filters and collimators
●Four types of X-ray spots are available for selection: Φ 0.1mm, Φ 0.3mm, Φ 0.7mm, Φ 1.2mm, Φ 2.0mm, Φ 5.0mm, and Φ 7.0mm
●Configure or customize X-ray spot according to the actual needs of user applications.
switching power supply
●Imported high-performance switching power supply
cooling fan
●Imported low-noise, high air volume fan
● Dimensions:650mm×650mm×970mm
● Sample compartment size:650mm×650 mm×630 mm
●Net weight of the instrument: 50kg
●Power supply: AC220V/50Hz
●Maximum power: 330W
●Working temperature: 15-30 ℃
●Relative humidity: ≤ 85%, no condensation
