Dual band infrared emissivity tester - Material coating far-infrared emissivity analyzer IR-2

Dual band infrared emissivity tester - Material coating far-infrared emissivity analyzer IR-2
Emissivity is one of the fundamental parameters of material thermal properties. In recent years, with the development of infrared technology, radiation heat transfer, radiation measurement, solar energy research, materials science, and military target stabilization technology. The new emissivity measuring instrument adopts the testing principle of reflectivity method, which measures the normal reflectivity of the surface of the tested object by using an active blackbody radiation source, and then measures its normal emissivity in a specific infrared band. The dual band infrared emissivity tester material coating far-infrared emissivity analyzer IR-2 can measure the emissivity of samples at room temperature in three bands: 3 μ m-5 μ m, 8 μ m-14 μ m, and 1 μ m-22 μ m. When there is a special need, the dual band infrared emissivity tester material coating far-infrared emissivity analyzer IR-2 can heat or cool the sample in any temperature range of -100 ℃~600 ℃ through a dedicated temperature control device, thereby measuring the emissivity temperature of the sample.

Dual band infrared emissivity tester - Material coating far-infrared emissivity analyzer IR-2characteristic:

The instrument is equipped with a small standard blackbody radiation source and a six position high-precision microcomputer temperature controller (capable of displaying up to 1mK), which not only provides it with a stable and wide spectral measurement range, but also greatly improves its reliability and stability during measurement.

2. Adopting unique optical modulation technology, the measurement is not affected by surface radiation and environmental radiation of the tested object.

In order to ensure the measurement accuracy of the instrument, in the instrument design, considering the measurement error caused by sample diffuse reflection, in addition to the mirror reflection (MR) probe channel, a dedicated diffuse reflection (DR) compensation channel is also added.

4. By adopting phase-locked technology and microelectronics technology in signal and electronic processing, the detection of weak signals has been effectively achieved, further improving the performance of the instrument.

5. Easy to operate, convenient to use, and fast measurement speed.

6. Filter can be replaced as needed and tested in multiple infrared spectral bands.

7. The measurement process will not damage the tested sample.

8. Equipped with RS-232 serial port and reset button RST.

Dual band infrared emissivity testerMain technical indicators:

1.Measurement bands of 3-5 μ m, 8-14 μ m, and 1-22 μ m (if the user has special requirements, different band filters can be customized)

2. Emissivity measurement range: 0.1-0.99

3. Sensitivity NE Δε: 0.001

4. Indication error: ± 0.02 (ε>0.50)

5. Repeatability: ± 0.01

6. Sample temperature: Room temperature (-100 ° C)℃～600℃）

7. Sample size: diameter ≥ 50mm

8. Measurement time: 3 seconds

9. Display method: LED digital display, last digit 0.001

10. Power supply: AC 22V 50Hz