※ Simultaneously meet the requirementsROHS、 Analysis of materials such as halogens, coatings, alloys, etc | Using mature X-ray fluorescence technology |
Integrated FP method, Alpha coefficient method, and empirical coefficient method | ※ Can generate various humanized testing reports |
※ Soft hard combination design | ※ Easy to operate, one click operation design |
Intelligent software automatically sets parameters and filters | ※ Rapid non-destructive analysis of samples |
Multiple language operating systems | ※ Overtemperature protection and overload protection |
※ No consumables required |
1. Detector: Amptek Si PIN detector, high-speed pulse analysis system;
2. High voltage power supply: Spellman 50w(50kv/MA);
3. X-ray tube: 50w side window beryllium window type X-ray tube;
4. Energy resolution: 149eV;
5. Elemental analysis range: sulfur (S) - uranium (U);
6. Measurement time: 60-300 seconds;
7. Measurement range: 1ppm-99.9%;
8. AC 220V power supply equipment: 1KVA AC purification stabilized power supply;
9. Working temperature: 10-30 ° C;
10. Measurement conditions: atmospheric environment;

Amptek Si PIN detector |
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Amptek signal detection electronic circuit |
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Spellman High Voltage Power Supply |
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Side window beryllium window type X-ray tube |
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Computers and inkjet printers |
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ROHS and halogen-free testing for various products such as electronic appliances, hardware stamping, packaging plastics, etc.