■4XC-DCharacteristics and Applications of Digital Photography Metallographic Microscope:
1. Metallographic microscopes are used to identify and analyze the microstructure of various metals, alloys, and non-metallic materials, and are widely used in factories or laboratories for raw material inspection; Quality identification of castings or metallographic structure analysis after material processing; And conduct research on surface phenomena such as surface cracks and spraying, including metallographic analysis of steel, non-ferrous metal materials, castings, and coatings; Petrographic analysis in geology; As an effective means of conducting microscopic research on compounds and ceramics in the industrial field, it is an essential instrument for studying the microstructure of materials in metallurgy and materials science, and a powerful assistant in scientific research and teaching.
2. More and more research no longer meets the conventional requirements of metallographic microscopy and photography. Inputting microscopic images into microcomputers for various post-processing is a new technology synchronized with the world today in the field of microscopy.

3. 4XC-DThe digital photography metallographic microscope is equipped with a high pixel digital photography system with multiple optical zoom, allowing for continuous selection of various magnification ratios. The image can be processed, edited, saved, and output (such as printing) by a computer or accessed through multimedia systems and email.
4. The system can be equipped with a professional quantitative metallographic image analysis computer operating system (software) for real-time research and analysis of metallographic spectra, such as grain size measurement and grading; Measurement and rating of non-metallic inclusions; Measurement and rating of pearlite and ferrite content; Measurement and rating of graphite spheroidization rate of ductile iron; Analysis, statistics, and output of graphic and textual reports on decarburization layer, carburizing layer measurement, and surface coating thickness measurement.

■ Technical parameter table of metallographic microscope

System configuration

■ Instrument completeness